Title :
Can EDA combat the rise of electronic counterfeiting?
Author :
Koushanfar, Farinaz ; Fazzari, Saverio ; McCants, Carl ; Bryson, William ; Song, Peilin ; Sale, Matthew ; Potkonjak, Miodrag
Author_Institution :
Rice Univ., Houston, TX, USA
Abstract :
The Semiconductor Industry Associates (SIA) estimates that counterfeiting costs the US semiconductor companies $7.5B in lost revenue, and this is indeed a growing global problem. Repackaging the old ICs, selling the failed test parts, as well as gray marketing, are the most dominant counterfeiting practices. Can technology do a better job than lawyers? What are the technical challenges to be addressed? What EDA technologies will work: embedding IP protection measures in the design phase, developing rapid post-silicon certification, or counterfeit detection tools and methods?
Keywords :
electronic design automation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; semiconductor industry; watermarking; EDA technologies; IP protection measures; SIA; US semiconductor companies; counterfeit detection tools; electronic counterfeiting; gray marketing; old IC repackaging; rapid post-silicon certification; semiconductor industry associates; Aging; Counterfeiting; Hardware; Integrated circuits; Logic gates; Stress; Threshold voltage; Counterfeiting; Device and IC aging; Reliability;
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4503-1199-1