• DocumentCode
    565154
  • Title

    Towards graceful aging degradation in NoCs through an adaptive routing algorithm

  • Author

    Bhardwaj, Kshitij ; Chakraborty, Koushik ; Roy, Sanghamitra

  • Author_Institution
    USU Bridge Lab., Utah State Univ., Logan, UT, USA
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    382
  • Lastpage
    391
  • Abstract
    Continuous technology scaling has made aging mechanisms such as Negative Bias Temperature Instability (NBTI) and electromigration primary concerns in Network-on-Chip (NoC) designs. In this paper, we model the effects of these aging mechanisms on NoC components such as routers and links using a novel reliability metric called Traffic Threshold per Epoch (TTpE). We observe a critical need of a robust aging-aware routing algorithm that not only reduces power-performance overheads caused due to aging degradation but also minimizes the stress experienced by heavily utilized routers and links. To solve this problem, we propose an aging-aware adaptive routing algorithm and a router microarchitecture that routes the packets along the paths which are both least congested and experience minimum aging stress. After an extensive experimental analysis using real workloads, we observe a 13%, 12.7% average overhead reduction in network latency and Energy-Delay-Product-Per-Flit (EDPPF) and a 10.4% improvement in performance using our aging-aware routing algorithm.
  • Keywords
    circuit reliability; network routing; network-on-chip; NoC design; aging-aware adaptive routing algorithm; electromigration; energy-delay-product-per-flit; graceful aging degradation; negative bias temperature instability; network-on-chip; reliability metric; router microarchitecture; traffic threshold per epoch; Aging; Algorithm design and analysis; Degradation; Electromigration; Reliability; Routing; Stress; Aging; Electromigration; NBTI; NoC; Routing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241536