• DocumentCode
    565190
  • Title

    PowerField: A transient temperature-to-power technique based on Markov random field theory

  • Author

    Seungwook Paek ; Seok-Hwan Moon ; Wongyu Shin ; Jaehyeong Sim ; Lee-Sup Kim

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    630
  • Lastpage
    635
  • Abstract
    Transient temperature-to-power conversion is as important as steady-state analysis since power distributions tend to change dynamically. In this work, we propose PowerField framework to find the most probable power distribution from consecutive thermal images. Since the transient analysis is vulnerable to spatio-temporal thermal noise, we adopted a maximum-a-posteriori Markov random field framework to enhance the noise immunity. The most probable power map is obtained by minimizing the energy function which is calculated using an approximated transient thermal equation. Experimental results with a thermal simulator shows that PowerField outperforms the previous method in transient analysis reducing the error by half on average. We also applied our method to a real silicon achieving 90.7% accuracy.
  • Keywords
    Markov processes; infrared imaging; maximum likelihood estimation; power distribution; power measurement; random processes; Markov random field theory; PowerField; energy function; maximum-a-posteriori framework; noise immunity; power distribution; spatiotemporal thermal noise; steady-state analysis; thermal image; thermal simulator; transient analysis; transient temperature-to-power conversion; transient thermal equation; Estimation; Heating; Mathematical model; Power measurement; Steady-state; Temperature measurement; Transient analysis; Markov random field; Power; post-silicon verification; thermal imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241572