DocumentCode
565190
Title
PowerField: A transient temperature-to-power technique based on Markov random field theory
Author
Seungwook Paek ; Seok-Hwan Moon ; Wongyu Shin ; Jaehyeong Sim ; Lee-Sup Kim
Author_Institution
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear
2012
fDate
3-7 June 2012
Firstpage
630
Lastpage
635
Abstract
Transient temperature-to-power conversion is as important as steady-state analysis since power distributions tend to change dynamically. In this work, we propose PowerField framework to find the most probable power distribution from consecutive thermal images. Since the transient analysis is vulnerable to spatio-temporal thermal noise, we adopted a maximum-a-posteriori Markov random field framework to enhance the noise immunity. The most probable power map is obtained by minimizing the energy function which is calculated using an approximated transient thermal equation. Experimental results with a thermal simulator shows that PowerField outperforms the previous method in transient analysis reducing the error by half on average. We also applied our method to a real silicon achieving 90.7% accuracy.
Keywords
Markov processes; infrared imaging; maximum likelihood estimation; power distribution; power measurement; random processes; Markov random field theory; PowerField; energy function; maximum-a-posteriori framework; noise immunity; power distribution; spatiotemporal thermal noise; steady-state analysis; thermal image; thermal simulator; transient analysis; transient temperature-to-power conversion; transient thermal equation; Estimation; Heating; Mathematical model; Power measurement; Steady-state; Temperature measurement; Transient analysis; Markov random field; Power; post-silicon verification; thermal imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-4503-1199-1
Type
conf
Filename
6241572
Link To Document