• DocumentCode
    565211
  • Title

    The DAC 2012 routability-driven placement contest and benchmark suite

  • Author

    Viswanathan, Natarajan ; Alpert, Charles ; Sze, Cliff ; Li, Zhuo ; Wei, Yaoguang

  • Author_Institution
    IBM Corp., Austin, TX, USA
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    774
  • Lastpage
    782
  • Abstract
    Existing routability-driven placers mostly employ rudimentary and often crude congestion models that fail to account for the complexities in modern designs, e.g., the impact of non-uniform wiring stacks, layer directives, partial and/or complete routing blockages, etc. In addition, they are hampered by congestion metrics that do not accurately score or represent design congestion. This is in large part due to the non-availability of public designs depicting industrial wiring stacks and other complexities affecting design routability. The aim of the DAC 2012 routability-driven placement contest is to address these issues, by way of the following: (a) release challenging benchmark designs that are derived from modern industrial ASICs, and contain information to perform both placement and routing, (b) present a new congestion metric, as well as an accurate congestion analysis framework to evaluate and compare the routability of various placement algorithms. We hope that a set of challenging benchmarks, along with a standard, publicly available evaluation framework will further advance research in routability-driven placement.
  • Keywords
    application specific integrated circuits; integrated circuit design; network routing; benchmark design; congestion metrics; crude congestion model; design congestion; design routability; industrial wiring stacks; modern industrial ASIC; routability driven placement; Benchmark testing; Measurement; Nickel; Pins; Routing; Wiring; Benchmarks; Congestion Analysis; Physical Design; Placement; Routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241593