DocumentCode :
565235
Title :
Automated feature localization for hardware designs using coverage metrics
Author :
Malburg, Jan ; Finder, Alexander ; Fey, Görschwin
Author_Institution :
Univ. of Bremen, Bremen, Germany
fYear :
2012
fDate :
3-7 June 2012
Firstpage :
941
Lastpage :
946
Abstract :
Due to the increasing complexity modern System on Chip designs are developed by large design teams. In addition, existing design blocks are re-used such that the knowledge about these parts of the design entirely depends on the quality of the documentation. For a single designer it is almost impossible to have detailed knowledge about all blocks and their interaction. We introduce a simulation-based automation technique to support design understanding. Based on use cases provided by the designer and on their coverage information, the proposed technique identifies parts of the source code that are relevant for a certain functional feature. In two case studies the technique is shown to be at least as exact as reading the documentation with two important advantages: the automated approach is fast and more precise than the existing documentation for the inspected designs.
Keywords :
electronic design automation; integrated circuit design; system-on-chip; automated feature localization; coverage metrics; documentation quality; functional feature; hardware designs; inspected designs; simulation-based automation technique; source code identification; system-on-chip designs; Color; Documentation; Hardware; Hardware design languages; Measurement; Prototypes; Software; Design Understanding; Feature Localization; Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-4503-1199-1
Type :
conf
Filename :
6241617
Link To Document :
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