• DocumentCode
    565268
  • Title

    Near-threshold voltage (NTV) design — Opportunities and challenges

  • Author

    Kaul, Himanshu ; Anders, Mark ; Hsu, Steven ; Agarwal, Amit ; Krishnamurthy, Ram ; Borkar, Shekhar

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    1149
  • Lastpage
    1154
  • Abstract
    Moore´s Law will continue providing abundance of transistors for integration, only to be limited by the energy consumption. Near threshold voltage (NTV) operation has potential to improve energy efficiency by an order of magnitude. We discuss design techniques necessary for reliable operation over a wide range of supply voltage - from nominal down to subthreshold region. The system designed for NTV can dynamically select modes of operation, from high performance, to high energy efficiency, to the lowest power.
  • Keywords
    VLSI; integrated circuit design; integrated circuit reliability; Moore Law; NTV; VLSI technology scaling; energy consumption; energy efficiency improvement; near-threshold voltage design; subthreshold region; Energy efficiency; Flip-flops; Frequency measurement; Logic gates; Multiplexing; Threshold voltage; Transistors; NTV; energy; performance; power; subthreshold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4503-1199-1
  • Type

    conf

  • Filename
    6241650