Title :
ONU tester for diagnosis of TDMA-PON using multi-point control protocol messages
Author :
Oishi, Masayuki ; Horiuchi, Yukio ; Nishimura, Kosuke
Author_Institution :
KDDI R&D Labs. Inc., Fujimino, Japan
Abstract :
We report an ONU tester prototype employing our proposed diagnosis technique for TDMA-PON utilizing MPCP messages in order to solve rogue-ONU and optical multiple-reflection problems. We experimentally confirm that our proposed method can identify such failures without any modification of already installed ONUs.
Keywords :
passive optical networks; protocols; time division multiple access; MPCP messages; ONU tester; TDMA-PON; diagnosis technique; multipoint control protocol messages; optical multiple-reflection problems; rogue-ONU; Optical attenuators; Optical network units; Optical noise; Optical pulses; Optical reflection; Passive optical networks; Signal to noise ratio;
Conference_Titel :
Optical Internet (COIN), 2012 10th International Conference on
Conference_Location :
Yokohama, Kanagawa
Print_ISBN :
978-1-4673-1654-5
