DocumentCode
566232
Title
Temporary bonding strength control for self-assembly-based 3D integration
Author
Fukushima, Takafumi ; Ohara, Yuki ; Bea, Jicheol ; Murugesan, Mariappan ; Lee, Kang-Wook ; Tanaka, Tetsu ; Koyanagi, Mitsumasa
Author_Institution
New Ind. Creation Hatchery Center (NICHe), Tohoku Univ., Sendai, Japan
fYear
2012
fDate
Jan. 31 2012-Feb. 2 2012
Firstpage
1
Lastpage
4
Abstract
We have demonstrated bonding strength control for self-assembly-based 3D integration in which many chips are instantly assembled on a wafer all at once by using liquid droplets, and then, temporarily bonded to the wafer. The wafer is named Reconfigured Wafer. The self-assembly-based multichip-to-wafer 3D stacking is called reconfigured-wafer-to-wafer 3D integration. The alignment accuracy is found to be within 1 μm and the temporal bonding strength is well controlled by the quality of oxides as a bonding interface material, liquid types (concentration of additives), total bonding area, and surface roughness of the oxides. The self-assembled and temporarily bonded chips are successfully transferred to another wafer in a face-to-face bonding manner in batch processing.
Keywords
integrated circuit bonding; self-assembly; surface roughness; three-dimensional integrated circuits; batch processing; bonding interface material; liquid droplets; reconfigured wafer; reconfigured-wafer-to-wafer 3D integration; self-assembly-based 3D integration; self-assembly-based multichip-to-wafer 3D stacking; surface roughness; temporarily bonded chips; temporary bonding strength control; wafer assembly; Bonding; Electron devices; Liquids; Rough surfaces; Self-assembly; Stacking; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
3D Systems Integration Conference (3DIC), 2011 IEEE International
Conference_Location
Osaka
Print_ISBN
978-1-4673-2189-1
Type
conf
DOI
10.1109/3DIC.2012.6262954
Filename
6262954
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