• DocumentCode
    567112
  • Title

    Reliability evaluation based on DAD using non-stationary time series method

  • Author

    Wang, Li ; Zhang, Huiyan ; Xue, Hong

  • Author_Institution
    Sch. of Comput. & Inf. Eng., Beijing Technol. & Bus. Univ., Beijing, China
  • Volume
    1
  • fYear
    2012
  • fDate
    18-20 May 2012
  • Firstpage
    102
  • Lastpage
    106
  • Abstract
    For taking into account implements of stochastic nature of environmental variables in reliability evaluation of Degradation Test (DT), this paper proposes a new DT reliability evaluation method based on Degradation Amount Distribution (DAD) using non-stationary time series analysis. A DT of a certain electronic product is conducted, and product reliability evaluation is obtained by the suggested method. The results show that the suggested reliability evaluation method is more reasonable than traditional reliability evaluation method.
  • Keywords
    Degradation Amount Distribution; Degradation Test; Non-Stationary Time Series; Reliability Evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measurement, Information and Control (MIC), 2012 International Conference on
  • Conference_Location
    Harbin, China
  • Print_ISBN
    978-1-4577-1601-0
  • Type

    conf

  • DOI
    10.1109/MIC.2012.6273309
  • Filename
    6273309