DocumentCode
567112
Title
Reliability evaluation based on DAD using non-stationary time series method
Author
Wang, Li ; Zhang, Huiyan ; Xue, Hong
Author_Institution
Sch. of Comput. & Inf. Eng., Beijing Technol. & Bus. Univ., Beijing, China
Volume
1
fYear
2012
fDate
18-20 May 2012
Firstpage
102
Lastpage
106
Abstract
For taking into account implements of stochastic nature of environmental variables in reliability evaluation of Degradation Test (DT), this paper proposes a new DT reliability evaluation method based on Degradation Amount Distribution (DAD) using non-stationary time series analysis. A DT of a certain electronic product is conducted, and product reliability evaluation is obtained by the suggested method. The results show that the suggested reliability evaluation method is more reasonable than traditional reliability evaluation method.
Keywords
Degradation Amount Distribution; Degradation Test; Non-Stationary Time Series; Reliability Evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Measurement, Information and Control (MIC), 2012 International Conference on
Conference_Location
Harbin, China
Print_ISBN
978-1-4577-1601-0
Type
conf
DOI
10.1109/MIC.2012.6273309
Filename
6273309
Link To Document