DocumentCode :
567990
Title :
Fabrication and characterization of thin-film transistor using dielectrophoretic assembly of single-walled carbon nanotube
Author :
Toda, Tatsuya ; Kawaharamura, Toshiyuki ; Furusawa, Hiroshi ; Furuta, Mamoru
Author_Institution :
Sch. of Environ. Sci. & Eng., Kochi Univ. of Technol., Kami, Japan
fYear :
2012
fDate :
4-6 July 2012
Firstpage :
191
Lastpage :
194
Abstract :
A single-walled carbon nanotube thin-film transistor (SWNT TFT) was formed using aligned SWNT channels assembled by the dielectrophoretic (DEP) process. The density of assembled SWNTs was controlled by the DEP factors (concentration of SWNT solution and applied AC voltage). The on/off current ratio of the SWNT TFT was improved by decreasing SWNT density in a channel-achieved 4.0 × 105-while the motility and on/off ratio still showed a reversible manner. DEP assembly is an effective method to achieve well-aligned and density-controlled SWNT channels for TFT applications.
Keywords :
carbon nanotube field effect transistors; carbon nanotubes; electrophoresis; thin film transistors; C; DEP factors; density-controlled SWNT channels; dielectrophoretic assembly; on-off current ratio; single-walled carbon nanotube thin-film transistor; well-aligned SWNT channels; Assembly; Carbon nanotubes; Dielectrophoresis; Electrodes; Electron tubes; Logic gates; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2012 19th International Workshop on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-0399-6
Type :
conf
Filename :
6294878
Link To Document :
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