DocumentCode
568300
Title
A digital demodulation method for electrical tomography based on sine wave rectification
Author
Zhou, Haili ; Xu, Lijun ; Cao, Zhang ; Fan, Shangchun ; Pei, Hong
Author_Institution
Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China
fYear
2012
fDate
16-17 July 2012
Firstpage
558
Lastpage
561
Abstract
In this paper, a digital demodulation method used for AC-based electrical tomography systems is presented. The demodulation result can be easily obtained by rectifying the sinusoidal measurement signal in a digital way. The proposed demodulation method has some distinguished characteristics: (a) with a concise configuration, it can be implemented on simple digital signal processors without hardware multipliers, e.g. Complex Programmable Logic Device (CPLD); (b) no reference signals are involved, (c) according to the requirements of precision and Signal-to-Noise Ratio (SNR), the demodulation process can be accomplished within k/2 (k=1, 2, 3, ...) sine wave periods; and (d) the effectiveness of the proposed method is not influenced by the starting time of demodulation. Mathematical analysis and numerical simulation results are presented to prove the feasibility and effectiveness of the digital demodulation method based on sine wave rectification.
Keywords
demodulation; programmable logic devices; signal processing; tomography; waveform generators; AC-based electrical tomography system; CPLD; SNR; complex programmable logic device; demodulation process; digital demodulation method; digital signal processor; hardware multiplier; mathematical analysis; numerical simulation; reference signals; signal-to-noise ratio; sine wave period; sine wave rectification; sinusoidal measurement signal rectification; Demodulation; Digital signal processors; Frequency measurement; Hardware; Phase measurement; Signal to noise ratio; Tomography; AC-based; Digital demodulation; Electrical tomography; Sine wave rectification;
fLanguage
English
Publisher
ieee
Conference_Titel
Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
Conference_Location
Manchester
Print_ISBN
978-1-4577-1776-5
Type
conf
DOI
10.1109/IST.2012.6295530
Filename
6295530
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