DocumentCode
568573
Title
Design, Synthesis and Test of Reversible Circuits for Emerging Nanotechnologies
Author
Thapliyal, Himanshu ; Ranganathan, Nagarajan
Author_Institution
Dept. of CSE, Univ. of South Florida, Tampa, FL, USA
fYear
2012
fDate
19-21 Aug. 2012
Firstpage
5
Lastpage
6
Abstract
Reversible circuits can generate unique output vector from each input vector, and vice-versa, that is, there is a one-to-one mapping between the input and the output vectors. The contributions of the dissertation include a novel reversible gate particularly suitable for reversible arithmetic, several designs for reversible arithmetic such as binary and BCD adders, sub tractors and comparators, a set of reversible sequential circuits such as latches, flip-flops, and shift registers. Unlike previous works, the above designs are optimized for multiple parameters such as ancilla and garbage bits, quantum cost and delay. Another important contribution is the application of conservative reversible logic towards online and offline testing of single as well as multiple faults in reversible as well as traditional logic VLSI circuits.
Keywords
VLSI; adders; comparators (circuits); flip-flops; logic design; logic testing; nanotechnology; sequential circuits; shift registers; BCD adders; ancilla; binary adders; comparators; delay; dissertation; flip-flops; garbage bits; input vector; latches; logic VLSI circuits; nanotechnology; offline testing; one-to-one mapping; online testing; output vector; quantum cost; reversible arithmetic; reversible circuit design; reversible circuit synthesis; reversible circuit testing; reversible gate; reversible logic; reversible sequential circuits; shift registers; subtractors; Circuit faults; Delay; Design methodology; Logic circuits; Logic gates; Quantum computing; Very large scale integration; Conservative Logic; Quantum Computing; Quantum Dot Cellular Automata; Reversible Logic; TR Gate;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
Conference_Location
Amherst, MA
ISSN
2159-3469
Print_ISBN
978-1-4673-2234-8
Type
conf
DOI
10.1109/ISVLSI.2012.83
Filename
6296438
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