DocumentCode :
569786
Title :
Reliability of Wireless Sensor Network: Hotspot and critical challenges
Author :
Yao, Nan ; Wang, Shaoping ; Shang, Yaoxing ; Shi, Jian
Author_Institution :
Sci. & Technol. on Aerocraft Control Lab., Beihang Univ., Beijing, China
fYear :
2012
fDate :
25-27 July 2012
Firstpage :
1262
Lastpage :
1266
Abstract :
Wireless Sensor Network (WSN) has attracted many concerns in different domains because of its special features. A WSN is a set of a large number of resource constrained sensor nodes which have abilities for information detection, data processing, and short-range radio communication. WSN can be used for both military applications and civil applications with the tasks such as detection and monitoring of significant events in different environments or large areas. How to improve the reliability of WSN is one of the essential challenges for WSN from theoretical research to actual application. Five hot research interests have been discussed respectively in this paper, and several relevant state-of-the-art technologies have been analyzed, then, future direction and critical technologies are proposed as well. In addition, a Generalized Stochastic Petri nets (GSPN) model is designed to evaluate the reliability of a parallel-redundant fault tolerant WSN. GSPN model is more observable, scalable and portable than Markov model.
Keywords :
Markov processes; Petri nets; fault tolerance; telecommunication network reliability; wireless sensor networks; GSPN model; Markov model; WSN reliability; critical challenges; data processing; generalized stochastic petri nets; hotspot; information detection; parallel-redundant fault tolerant WSN; short-range radio communication; state-of-the-art technologies; wireless sensor network reliability; Computer network reliability; Fault tolerance; Fault tolerant systems; Protocols; Reliability theory; Wireless sensor networks; Fault tolerance; Generalized Stochastic Petri nets (GSPN); Protocol; Reliability; Wireless Sensor Network (WSN);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Informatics (INDIN), 2012 10th IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-0312-5
Type :
conf
DOI :
10.1109/INDIN.2012.6301383
Filename :
6301383
Link To Document :
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