DocumentCode
570271
Title
Dependance of critical dimension on learning machines and ranking methods
Author
Suryakumar, Divya ; Sung, Andrew H. ; Liu, Qingzhong
Author_Institution
Dept. of Comput. Sci. & Eng., New Mexico Inst. of Min. & Technol., Socorro, NM, USA
fYear
2012
fDate
8-10 Aug. 2012
Firstpage
738
Lastpage
739
Abstract
Feature reduction is a major problem in data mining. Though traditional methods such as feature ranking and subset selection have been widely used, there has been little consideration given to assuring satisfactory performance of a learning machine in relation to the minimum of features required or the “critical dimension”. This critical dimension is unique to a specific dataset, learning machine, and ranking algorithm combination. The empirical methods demonstrate that many datasets show the existence of critical dimension. The dependence of this critical dimension on the learning machines and ranking algorithms could provide newer insights in understanding datasets, machine learning classifiers and ranking algorithms. The preliminary results of analysis show that the critical dimension depends largely on the feature ranking algorithm and that learning machines are less significant in determining the critical dimension.
Keywords
data mining; learning (artificial intelligence); pattern classification; critical dimension dependance; data mining; empirical methods; feature ranking algorithm; feature reduction; machine learning classifiers; ranking algorithm combination; ranking methods; subset selection; Accuracy; Feature extraction; Machine learning; Machine learning algorithms; Niobium; Radio frequency; Support vector machines; Feature reduction; machine learning; ranking;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Reuse and Integration (IRI), 2012 IEEE 13th International Conference on
Conference_Location
Las Vegas, NV
Print_ISBN
978-1-4673-2282-9
Electronic_ISBN
978-1-4673-2283-6
Type
conf
DOI
10.1109/IRI.2012.6303086
Filename
6303086
Link To Document