• DocumentCode
    570335
  • Title

    Influence of voltage sags on dynamic voltage behavior with massive inverter-based loads

  • Author

    Yamashita, Koji ; Kitauchi, Yoshihiro ; Katsuragi, Keisuke

  • Author_Institution
    Central Res. Inst. of Electr. Power Ind., Tokyo, Japan
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The self-disconnection of photovoltaics (PVs) due to voltage sags can make the voltage sags more severe, because the sudden loss of PVs at the voltage sags increases the apparent load, which consists of the net loads and PVs. The voltage sags cause the self-disconnection of loads as well as PVs. Because inverter-based loads are easily disconnected from the power system, the self-disconnection of such loads causes a significant rise in post-disturbance voltage, which is a major concern in Japan. Therefore, the influence of the self-disconnection of massive inverter-based loads on dynamic voltage behavior was clarified ahead of examining the influence of the self-disconnection of massive PVs. A sensitivity analysis of dynamic voltage behavior on induction motors as well as the self-disconnection of loads through time-domain simulation using real system data is presented. The anticipated dynamic voltage behavior with massive inverter-based loads is also discussed.
  • Keywords
    induction motors; invertors; photovoltaic power systems; power supply quality; power system faults; time-domain analysis; Japan; dynamic voltage behavior; induction motors; massive inverter-based loads; photovoltaics self-disconnection; post-disturbance voltage; power system; real system data; time-domain simulation; voltage sags; Indexes; Induction motors; Load modeling; Power quality; Power system dynamics; Reactive power; Voltage fluctuations; Fault Ride Through requirement; medium-voltage network; photovoltaic power generation; power system; voltage sag;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Smart Grid Technologies - Asia (ISGT Asia), 2012 IEEE
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4673-1221-9
  • Type

    conf

  • DOI
    10.1109/ISGT-Asia.2012.6303151
  • Filename
    6303151