DocumentCode
573608
Title
Do more camera pixels result in a better picture?
Author
Chapman, Glenn H. ; Koren, Israel ; Koren, Zahava
Author_Institution
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
fYear
2012
fDate
27-29 June 2012
Firstpage
73
Lastpage
78
Abstract
A digital camera sensor will incur pixel defects both in fabrication and during its lifetime. While manufacturing defects are corrected in the factory, in-field defects are prohibitively expensive to fix, and can eventually affect the picture quality. During the last 10 years, we have conducted a study of defect development in digital imagers, in which we had access to about 40 cameras and a database of past photos taken by them. The data we collected allows us to quantify characteristics of defect growth. Our investigations have shown that pixel defects are permanent, and their number grows with time. We found that the main type of defect is hot pixels, which are pixels that appear as a bright spot in the image even without any illumination. We also observed that the defects are distributed randomly over the sensor area and are not clustered. By studying past pictures of each given camera we found that the defect growth rate is constant over time. These spatial and temporal characteristics led us to the conclusion that defects are not likely related to material degradation or imperfect fabrication, but are caused by environmental stress such as cosmic rays radiation. Measuring the effect on the defect rate of sensor parameters such as sensor area, number of pixels, pixel size, and sensor technology (CCD - Charge Coupled Device vs. APS - Active Pixel Sensor) yielded a power law, implying that increasing the number of pixels by shrinking the pixel size will result in a higher defect rate and is, therefore, not recommended.
Keywords
CCD image sensors; cameras; random processes; spatiotemporal phenomena; defect development; defect growth rate; digital camera sensor; digital imager; environmental stress; imperfect fabrication; manufacturing defect; material degradation; picture quality; pixel defect; power law; random distribution; spatial characteristics; temporal characteristics; Cameras; Charge coupled devices; Distribution functions; Lighting; Materials; Size measurement; Testing; APS; CCD; CMOS image sensor; Radiation; active pixel sensor; charge coupled device; defect detection; defect rate prediction; hot pixel; imager defects;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location
Sitges
Print_ISBN
978-1-4673-2082-5
Type
conf
DOI
10.1109/IOLTS.2012.6313844
Filename
6313844
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