DocumentCode
574368
Title
Oscillation-synchronous control of a frequency-measuring atomic force microscope
Author
Amin-Shahidi, D. ; Trumper, D.L.
Author_Institution
Mech. Eng. Dept., Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear
2012
fDate
27-29 June 2012
Firstpage
2479
Lastpage
2484
Abstract
We present a frequency-measuring atomic force microscope (AFM) system which uses a novel oscillation-synchronous period-feedback controller. Execution of the AFM´s control algorithm synchronously to the tip oscillation allows low-noise and high-precision surface tracking. We use a digital FPGA-based controller to implement this control technique. We use simulation and experimental results to demonstrate the effectiveness of this method.
Keywords
atomic force microscopy; digital control; feedback; field programmable gate arrays; frequency control; frequency measurement; oscillations; sensors; AFM control algorithm; digital FPGA-based controller; frequency-measuring AFM system; frequency-measuring atomic force microscope system; high-precision surface tracking; low-noise surface tracking; oscillation-synchronous period-feedback controller; self-sensing AFM probe; Bandwidth; Frequency control; Frequency measurement; Noise; Oscillators; Probes; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2012
Conference_Location
Montreal, QC
ISSN
0743-1619
Print_ISBN
978-1-4577-1095-7
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2012.6314953
Filename
6314953
Link To Document