DocumentCode
575058
Title
A passivation layer built-up multilayer on crypto-processors against mechanical damages
Author
Bruce, Ndibanje ; Lee, Hoon Jae
Author_Institution
Dept. of Ubiquitous IT, Dongseo Univ., Busan, South Korea
fYear
2011
fDate
Nov. 29 2011-Dec. 1 2011
Firstpage
631
Lastpage
635
Abstract
Mechanical damage to the final passivation layer of the crypto-processor is one of attacks methods used for extracting the secret data. The damage can be in the form of cracks, scratches which can affect the circuit performance and the most cases lead to the destruction of the chip. Thus the final passivation layer needs specifics properties to counter these attacks. This paper propose a passivation layer built-up multilayer characterized by a deposit on the IC of a first layer from hard dielectric material and a deposit on that layer a second layer from a soft dielectric material. The third layer from hard dielectric material is deposited on the second layer. The soft layer between two hard layers absorbs the mechanical stresses from the outside and in particular avoids the propagation of cracks in the hard layers of dielectric material. The outer hard layer prevents the plastic deformation of the soft layer. The soft layer is provided by a polymer layer while the hard layer is provided by silicon dioxide (SiO2) and silicon nitride (Si3N4).
Keywords
cryptography; dielectric materials; microprocessor chips; passivation; IC; circuit performance; crypto-processors; hard dielectric material; mechanical damage; mechanical stresses; passivation layer built-up multilayer; plastic deformation; polymer layer; secret data extraction; silicon dioxide; silicon nitride; soft dielectric material; Computers; Educational institutions; Crypto-processor; Mechanical damages; Passivation layer;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Sciences and Convergence Information Technology (ICCIT), 2011 6th International Conference on
Conference_Location
Seogwipo
Print_ISBN
978-1-4577-0472-7
Type
conf
Filename
6316694
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