Title :
Simulation geometry rasterization for applications toward graphene interconnect characterization
Author :
Rautio, Brian J. ; Long, Qi ; Agrawal, Amit ; EL Sabbagh, Mahmoud A.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY, USA
Abstract :
In this work, we present a novel methodology for geometric rasterization of arbitrary 3D planar geometries, and apply it to perform electromagnetic simulation based calibration for accurate high-frequency measurements of Graphene conductivity. The conductivity measurements may find application in the area of high-frequency Graphene-based circuits, specifically that of interconnects. Preliminary experimental and simulation results are shown and discussed.
Keywords :
calibration; graphene; interconnections; C; arbitrary 3D planar geometry; electromagnetic simulation based calibration; graphene conductivity measurements; graphene interconnect characterization; high-frequency graphene-based circuits; high-frequency measurements; simulation geometry rasterization; Conductivity; Fixtures; Geometry; Glass; Microwave measurements; Optical imaging;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
978-1-4673-2061-0
DOI :
10.1109/ISEMC.2012.6351813
