• DocumentCode
    576600
  • Title

    Polarimetric multi-angular Radarsat-2 data sensitivity to surface parameters

  • Author

    Wang, Hongquan ; Allain, Sophie ; Méric, Stéphane ; Pottier, Eric

  • Author_Institution
    SAPHIR Team, Inst. of Electron. & Telecommun. of Rennes (IETR), Rennes, France
  • fYear
    2012
  • fDate
    22-27 July 2012
  • Firstpage
    5125
  • Lastpage
    5128
  • Abstract
    The objective of this study is to evaluate the potential of C-band polarimetric multi-angular Radarsat-2 datasets to characterize soil moisture and surface roughness over bare agricultural fields. The polarimetric parameters derived from single angular and dual angular SAR data are examined to analyze the polarimetric sensitivities to bare surfaces. In the case of single angular analysis, the results show that smooth surfaces can be separated from medium rough as well as rough surfaces. Polarimetric parameters SRalpha1, ρhhvv have potentials to characterize soil moisture. In the case of dual angular analysis, the backscattering coefficient differences between two incidence angles Δσ in HH and VV polarization depend negatively on surface roughness and positively on soil moisture.
  • Keywords
    geophysical techniques; remote sensing by radar; soil; synthetic aperture radar; C-band polarimetric multiangular Radarsat-2 datasets; HH polarization; SRalpha1 polarimetric parameters; VV polarization; agricultural fields; backscattering coefficient; bare surfaces; dual angular SAR data; dual angular analysis; polarimetric multiangular Radarsat-2 data sensitivity; polarimetric parameters; polarimetric sensitivities; single angular SAR data; single angular analysis; smooth surfaces; soil moisture; surface roughness; Backscatter; Rough surfaces; Sensitivity; Soil moisture; Surface roughness; Synthetic aperture radar; Radarsat-2; bare surface; multi-angular; polarimetric SAR; sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
  • Conference_Location
    Munich
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4673-1160-1
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2012.6352457
  • Filename
    6352457