• DocumentCode
    576736
  • Title

    Results of Displacement Damage Testing of the Intersil ISL70227SRH Dual Operational Amplifier

  • Author

    van Vonno, N.W. ; Hood, R.A. ; Mansilla, O. ; Thomson, E.J. ; Ballou, F.C.

  • Author_Institution
    Intersil Corp., Melbourne, FL, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We report results of displacement damage testing of the Intersil ISL70227SRH dual operational amplifier. This part uses a complementary bipolar SOI process. Samples were irradiated using 1MeV neutrons at the WSMR Fast Burst Reactor.
  • Keywords
    operational amplifiers; silicon-on-insulator; testing; Intersil ISL70227SRH dual operational amplifier; WSMR fast burst reactor; complementary bipolar SOI process; displacement damage testing; Gain; Inductors; Neutrons; Operational amplifiers; Power supplies; Radiation effects; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353707
  • Filename
    6353707
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=576736