DocumentCode :
57731
Title :
Influence and Mitigation of Longest Differential via Stubs on Transmission Waveform and Eye Diagram in a Thick Multilayered PCB
Author :
Guang-Hwa Shiue ; Chi-Lou Yeh ; Li-Sang Liu ; Hao Wei ; Wei-Cheng Ku
Author_Institution :
Dept. of Electron. Eng., Chung Yuan Christian Univ., Taoyuan, Taiwan
Volume :
4
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
1657
Lastpage :
1670
Abstract :
This paper investigates how the longest differential via stubs in a thick multilayered printed circuit board (PCB) affect the time-domain transmission (TDT) waveform and eye diagram. A reduction scheme is also proposed to mitigate the influence of the longest differential via stubs. The manner in which the time-domain reflection noise that is generated by the longest differential via stubs affects the TDT waveform is then investigated using a lattice diagram. Formulas for step voltages on the TDT waveform are derived by analyzing the lattice diagram. Next, the effects of parameters related to the longest differential via stubs on the TDT waveform are analyzed. A high-impedance difference scheme with/without additional air-via holes is proposed to mitigate the influence of the longest differential via stubs. This mitigation scheme significantly reduces the influence of the longest differential via stubs in a thick multilayered PCB not only in the time domain (TDT waveform and eye diagram) but also in the frequency domain (differential insertion loss |Sdd21|). Finally, favorable comparisons between the simulations and measurements in the time and frequency domains validate the proposed analyses and mitigation scheme.
Keywords :
frequency-domain analysis; lattice theory; microstrip transitions; printed circuits; time-domain analysis; vias; eye diagram; high impedance difference scheme; lattice diagram; longest differential via stubs; thick multilayered PCB; time domain reflection noise; time domain transmission waveform; Delay effects; Integrated circuit modeling; Lattices; Microstrip; Resonant frequency; Stripline; Time-domain analysis; Differential insertion loss; differential via stubs; eye diagram; lattice diagram; plated through-hole (PTH) vias; signal integrity; time-domain transmission (TDT);
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2014.2348860
Filename :
6892976
Link To Document :
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