DocumentCode
57731
Title
Influence and Mitigation of Longest Differential via Stubs on Transmission Waveform and Eye Diagram in a Thick Multilayered PCB
Author
Guang-Hwa Shiue ; Chi-Lou Yeh ; Li-Sang Liu ; Hao Wei ; Wei-Cheng Ku
Author_Institution
Dept. of Electron. Eng., Chung Yuan Christian Univ., Taoyuan, Taiwan
Volume
4
Issue
10
fYear
2014
fDate
Oct. 2014
Firstpage
1657
Lastpage
1670
Abstract
This paper investigates how the longest differential via stubs in a thick multilayered printed circuit board (PCB) affect the time-domain transmission (TDT) waveform and eye diagram. A reduction scheme is also proposed to mitigate the influence of the longest differential via stubs. The manner in which the time-domain reflection noise that is generated by the longest differential via stubs affects the TDT waveform is then investigated using a lattice diagram. Formulas for step voltages on the TDT waveform are derived by analyzing the lattice diagram. Next, the effects of parameters related to the longest differential via stubs on the TDT waveform are analyzed. A high-impedance difference scheme with/without additional air-via holes is proposed to mitigate the influence of the longest differential via stubs. This mitigation scheme significantly reduces the influence of the longest differential via stubs in a thick multilayered PCB not only in the time domain (TDT waveform and eye diagram) but also in the frequency domain (differential insertion loss |Sdd21|). Finally, favorable comparisons between the simulations and measurements in the time and frequency domains validate the proposed analyses and mitigation scheme.
Keywords
frequency-domain analysis; lattice theory; microstrip transitions; printed circuits; time-domain analysis; vias; eye diagram; high impedance difference scheme; lattice diagram; longest differential via stubs; thick multilayered PCB; time domain reflection noise; time domain transmission waveform; Delay effects; Integrated circuit modeling; Lattices; Microstrip; Resonant frequency; Stripline; Time-domain analysis; Differential insertion loss; differential via stubs; eye diagram; lattice diagram; plated through-hole (PTH) vias; signal integrity; time-domain transmission (TDT);
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2014.2348860
Filename
6892976
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