• DocumentCode
    57731
  • Title

    Influence and Mitigation of Longest Differential via Stubs on Transmission Waveform and Eye Diagram in a Thick Multilayered PCB

  • Author

    Guang-Hwa Shiue ; Chi-Lou Yeh ; Li-Sang Liu ; Hao Wei ; Wei-Cheng Ku

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Taoyuan, Taiwan
  • Volume
    4
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    1657
  • Lastpage
    1670
  • Abstract
    This paper investigates how the longest differential via stubs in a thick multilayered printed circuit board (PCB) affect the time-domain transmission (TDT) waveform and eye diagram. A reduction scheme is also proposed to mitigate the influence of the longest differential via stubs. The manner in which the time-domain reflection noise that is generated by the longest differential via stubs affects the TDT waveform is then investigated using a lattice diagram. Formulas for step voltages on the TDT waveform are derived by analyzing the lattice diagram. Next, the effects of parameters related to the longest differential via stubs on the TDT waveform are analyzed. A high-impedance difference scheme with/without additional air-via holes is proposed to mitigate the influence of the longest differential via stubs. This mitigation scheme significantly reduces the influence of the longest differential via stubs in a thick multilayered PCB not only in the time domain (TDT waveform and eye diagram) but also in the frequency domain (differential insertion loss |Sdd21|). Finally, favorable comparisons between the simulations and measurements in the time and frequency domains validate the proposed analyses and mitigation scheme.
  • Keywords
    frequency-domain analysis; lattice theory; microstrip transitions; printed circuits; time-domain analysis; vias; eye diagram; high impedance difference scheme; lattice diagram; longest differential via stubs; thick multilayered PCB; time domain reflection noise; time domain transmission waveform; Delay effects; Integrated circuit modeling; Lattices; Microstrip; Resonant frequency; Stripline; Time-domain analysis; Differential insertion loss; differential via stubs; eye diagram; lattice diagram; plated through-hole (PTH) vias; signal integrity; time-domain transmission (TDT);
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2014.2348860
  • Filename
    6892976