DocumentCode :
577405
Title :
Nanoindentation properties of as-soldered low-Ag SAC-Bi-Ni/Cu
Author :
Liu, Yang ; Sun, Fenglian ; Wang, Guojun ; Zou, Pengfei
Author_Institution :
School of Material Science and Engineering, Harbin University of Science and Technology, Harbin 150040, China
fYear :
2012
fDate :
18-21 Sept. 2012
Firstpage :
1
Lastpage :
4
Abstract :
In this study, the nanoindentation properties of the as-soldered low-Ag SAC-Bi-Ni solder alloys on Cu substrate were characterized. The overall evaluations on the elastic modulus, hardness, and creep properties of the new solder alloys were proposed based on the comparisons with low-Ag solder SAC0307, SAC0705, and high-Ag solder SAC305. Experimental results indicated that the hardness of the SAC solders without Bi and Ni addition varied from 127MPa to 196MPa. Meanwhile, the elastic modulus was between 29-36GPa, and the creep stress sensitivity was from 15 to 19. However, the hardness of low-Ag SAC-Bi-Ni solders was between 305-403MPa. Additionally, with Bi and Ni elements addition, the elastic modulus of SAC0705 increased to 35-63GPa, and the value of creep stress sensitivity reached to 25-45. It is clear that the addition of Bi and Ni in low-Ag SAC solder greatly improved its nanoindentation properties, which were critical for the solder joint reliability.
Keywords :
bismuth alloys; copper alloys; creep; elastic moduli; hardness; nanoindentation; nickel alloys; reliability; sensitivity analysis; silver alloys; soldering; solders; stress analysis; tin alloys; Cu; SAC solders; SnAgCuBiNi; as-soldered low-silver solder alloys; copper substrate; creep properties; creep stress sensitivity; elastic modulus; hardness; nanoindentation properties; solder joint reliability; Bismuth; Creep; Nickel; Sensitivity; Soldering; Sn-Ag-Cu(SAC) sodler; creep property; low-Ag; melt; nanoindentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Strategic Technology (IFOST), 2012 7th International Forum on
Conference_Location :
Tomsk
Print_ISBN :
978-1-4673-1772-6
Type :
conf
DOI :
10.1109/IFOST.2012.6357535
Filename :
6357535
Link To Document :
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