• DocumentCode
    57876
  • Title

    Polarization Features in Bistatic Scattering From Rough Surfaces

  • Author

    Johnson, Joel T. ; Ouellette, Jeffrey D.

  • Author_Institution
    Dept. of Electr., Ohio State Univ., Columbus, OH, USA
  • Volume
    52
  • Issue
    3
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    1616
  • Lastpage
    1626
  • Abstract
    A study of the bistatic scattering patterns of rough surfaces is reported. We utilize both approximate and numerically exact models for surface scattering, and focus in particular on the location of local minima in the normalized radar cross-section as a function of the polar and azimuthal scattering angles. It is shown that these minima locations are distinct for HH and VV polarized returns in the case of slight roughness, and that the minimum locations for VV polarization are dependent for this case on the permittivity of the surface. It is also shown that these behaviors are modified as the surface roughness increases. These results may be useful in the design of future bistatic methods for sensing rough surface properties; initial consideration of the remote sensing of surface permittivity for small height surfaces is provided as an example.
  • Keywords
    geophysical techniques; permittivity; polarisation; remote sensing by radar; rough surfaces; surface roughness; surface scattering; HH polarized returns; VV polarized returns; approximate model; azimuthal scattering angle function; bistatic scattering patterns; future bistatic method design; local minima location; minimum VV polarization locations; normalized radar cross-section; numerically exact model; polar scattering angle function; polarization features; rough surface property sensing; slight roughness; small height surfaces; surface permittivity; surface permittivity remote sensing; surface scattering; Layered media; remote sensing; rough surface scattering;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/TGRS.2013.2252909
  • Filename
    6515388