• DocumentCode
    580466
  • Title

    Relationship between the Flicker Criteria ΔV10 and Pst

  • Author

    Novitskiy, A. ; Schau, H.

  • Author_Institution
    Dept. of Electr. Power Supply, Tech. Univ. Ilmenau, Ilmenau, Germany
  • fYear
    2012
  • fDate
    17-20 June 2012
  • Firstpage
    803
  • Lastpage
    808
  • Abstract
    The short-term and the long-term value Pst and Plt are the common-used quantities for the characterization of flicker severity. But in some areas of Asia (Japan, Taiwan) power companies use another criterion for the flicker assessment - the voltage flicker index ΔV10 which characterizes the actual flicker with respect to an equivalent value of the voltage modulation component with the frequency of 10 Hz. It results that the same voltage fluctuation can be permissible according to one flicker criterion and non-permissible according to other flicker criterion. This requires double costs of flicker level verification, for example, for the new installations designed in the countries one flicker criterion and in the utilities other one is used. There are a lot of attempts to find a simple and reliable approach for the conversion from one index to the other one by multiplying the indices with a factor, but no universal method was developed. In the paper based on analytical calculations and on-site measurement results the ratio between both flicker assessment criteria is shown to be dependent on the signal parameters.
  • Keywords
    power supply quality; power system measurement; Asia; Japan; Plt; Pst; Taiwan; flicker assessment; flicker criteria ΔV10; flicker criterion; flicker level verification; flicker severity; on-site measurement; power companies; power quality; Fluctuations; Fluorescence; Frequency measurement; Frequency modulation; Voltage fluctuations; Voltage measurement; AC measurements; flicker assessment; power quality; spectral analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Harmonics and Quality of Power (ICHQP), 2012 IEEE 15th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1540-6008
  • Print_ISBN
    978-1-4673-1944-7
  • Type

    conf

  • DOI
    10.1109/ICHQP.2012.6381287
  • Filename
    6381287