• DocumentCode
    580906
  • Title

    Dispatching rule considering time-constraints on processes for semiconductor wafer fabrication facility

  • Author

    Li, L. ; Li, Y.F. ; Sun, Z.J.

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
  • fYear
    2012
  • fDate
    20-24 Aug. 2012
  • Firstpage
    407
  • Lastpage
    412
  • Abstract
    There are many constraints in a semiconductor wafer fabrication facility (fab), especially time-constraints on processes. This paper gives a dispatching rule considering time-constraints (DRTC) that makes use of such information as due date of a job, workload of a machine, occupation time of a job on a machine, and time constraint of a process. The relative importance of each category is determined by weighting parameters, which are set by learning simulation samples with a backward propagation neural network (BPNN). A real fab simulation model is used to demonstrate the proposed method. The simulation results indicate that DRTC is superior to common rules (such as FIFO, EDD, CR and SRPT ) and the existing dispatching rule used in the fab (called as PRIOR) with more movements of WIP and higher time-constraints satisfaction proportion.
  • Keywords
    dispatching; learning (artificial intelligence); neural nets; production engineering computing; semiconductor industry; BPNN; DRTC; WIP; backward propagation neural network; dispatching rule considering time-constraints; job occupation time; machine workload; process time constraint; real fab simulation model; semiconductor wafer fabrication facility; simulation sample learning; time-constraint satisfaction proportion; weighting parameters; Bismuth; Dispatching; Educational institutions; Indexes; Sputtering; Time factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2012 IEEE International Conference on
  • Conference_Location
    Seoul
  • ISSN
    2161-8070
  • Print_ISBN
    978-1-4673-0429-0
  • Type

    conf

  • DOI
    10.1109/CoASE.2012.6386370
  • Filename
    6386370