DocumentCode
58108
Title
On Timing Model Extraction and Hierarchical Statistical Timing Analysis
Author
Bing Li ; Ning Chen ; Yang Xu ; Schlichtmann, Ulf
Author_Institution
Inst. for Electron. Design Autom., Tech. Univ. Munchen, Munich, Germany
Volume
32
Issue
3
fYear
2013
fDate
Mar-13
Firstpage
367
Lastpage
380
Abstract
In this paper, we investigate the challenges of applying statistical static timing analysis in hierarchical design flow, where modules supplied by IP vendors are used to hide design details for IP protection and to reduce the complexity of design and verification. For the three basic circuit types, combinational, flip-flop-based, and latch-controlled, we propose methods for extracting timing models that contain interfacing and compressed internal constraints. Using these compact timing models, the runtime of full-chip timing analysis can be reduced, while circuit details from IP vendors are not exposed. We also propose a method for reconstructing correlation between modules during full-chip timing analysis. This correlation cannot be incorporated into timing models because it depends on the layout of the corresponding modules in the chip. In addition, we investigate how to apply the extracted timing models with the reconstructed correlation to evaluate the performance of the complete design. Experiments demonstrate that using the extracted timing models and reconstructed correlation full-chip timing analysis can be several times faster than applying the flattened circuit directly, while the accuracy of statistical timing analysis is still well maintained.
Keywords
combinational circuits; flip-flops; industrial property; logic design; statistical analysis; timing; IP protection; combinational circuits; flip-flops; full chip timing analysis; hierarchical design flow; hierarchical statistical timing analysis; intellectual property; latch controlled circuits; timing model extraction; Analytical models; Computational modeling; Delay; Integrated circuit modeling; Latches; Random variables; Correlation reconstruction; hierarchical design; statistical analysis; timing models;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2012.2228305
Filename
6461978
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