• DocumentCode
    585262
  • Title

    Simulation method for automotive electronic equipment immunity testing

  • Author

    Oguri, Y. ; Ichikawa, Kazuhisa

  • Author_Institution
    Eng. R&D Center, Denso Corp., Kariya, Japan
  • fYear
    2012
  • fDate
    17-21 Sept. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Since safety is critical for automotive electronics devices, severe immunity tests are applied, then automotive component suppliers have to spend time in design and testing. Using simulation is one of key to realize effective design and testing, however, conventional simulation techniques do not enable the designer to predict malfunction frequencies despite that they are important for devising solutions. This paper proposes a simulation technique for predicting malfunction frequencies, noticing the transmission level of applied noise. Using this technique, we verified that simulation results well agreed with measurement results for frequencies up to 200 MHz.
  • Keywords
    automotive electronics; immunity testing; safety systems; applied noise; automotive component suppliers; automotive electronic equipment; critical safety; immunity testing; malfunction frequency prediction; transmission level; Automotive engineering; Current measurement; Frequency measurement; Immunity testing; Impedance; Integrated circuit modeling; Radio frequency; BCI; DPI; modeling; radiated immunity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
  • Conference_Location
    Rome
  • ISSN
    2325-0356
  • Print_ISBN
    978-1-4673-0718-5
  • Type

    conf

  • DOI
    10.1109/EMCEurope.2012.6396710
  • Filename
    6396710