DocumentCode
585262
Title
Simulation method for automotive electronic equipment immunity testing
Author
Oguri, Y. ; Ichikawa, Kazuhisa
Author_Institution
Eng. R&D Center, Denso Corp., Kariya, Japan
fYear
2012
fDate
17-21 Sept. 2012
Firstpage
1
Lastpage
6
Abstract
Since safety is critical for automotive electronics devices, severe immunity tests are applied, then automotive component suppliers have to spend time in design and testing. Using simulation is one of key to realize effective design and testing, however, conventional simulation techniques do not enable the designer to predict malfunction frequencies despite that they are important for devising solutions. This paper proposes a simulation technique for predicting malfunction frequencies, noticing the transmission level of applied noise. Using this technique, we verified that simulation results well agreed with measurement results for frequencies up to 200 MHz.
Keywords
automotive electronics; immunity testing; safety systems; applied noise; automotive component suppliers; automotive electronic equipment; critical safety; immunity testing; malfunction frequency prediction; transmission level; Automotive engineering; Current measurement; Frequency measurement; Immunity testing; Impedance; Integrated circuit modeling; Radio frequency; BCI; DPI; modeling; radiated immunity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location
Rome
ISSN
2325-0356
Print_ISBN
978-1-4673-0718-5
Type
conf
DOI
10.1109/EMCEurope.2012.6396710
Filename
6396710
Link To Document