DocumentCode
585347
Title
Radiated immunity testing of integrated circuits in reverberation chambers
Author
Heinrich, Ralf ; Bechly, Robert ; Deutschmann, Bernd
Author_Institution
Teseq GmbH, Berlin, Germany
fYear
2012
fDate
17-21 Sept. 2012
Firstpage
1
Lastpage
4
Abstract
Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.
Keywords
immunity testing; integrated circuit testing; reverberation chambers; EUT orientation; high field strength; integrated circuit testing; radiated immunity testing; reverberation chamber; Antenna radiation patterns; Immunity testing; Integrated circuits; Reverberation chamber; TEM cells; EMC; emission; immunity; integrated circuits; reverberation chamber;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location
Rome
ISSN
2325-0356
Print_ISBN
978-1-4673-0718-5
Type
conf
DOI
10.1109/EMCEurope.2012.6396877
Filename
6396877
Link To Document