Title :
Rural, poor and catastrophic ICT area standardization and modeling
Author :
Bhalerao, Dipashree M. ; Riaz, M. Tahir ; Madsen, Ole Brun ; Prasad, Ramjee
Author_Institution :
Dept. of Electron. & Telecommun., Sinhgad Tech. Educ. Soc., Pune, India
Abstract :
Seventy percent of poor people are living in rural areas all over the world. After so much of development in all other (cities) areas, why efforts are fallen less for development of rural area? Reason may be lack of systematic approach towards it. The approach starts from areas definition and standardization of these definitions. It clearly shows that these areas are neglected. When they are not defined, how one will come to know the limitations of these areas from ICT point of view and will work on it. This Paper focuses on the definition, mathematical model and explains the important role of standardization in the definition, of these areas. Any ICT area is a combination of specific pattern of Okumura-Hata model, intensity E, and QoS parameters patterns like end to end delay, generated packets, received packets, distance between source and destination, number of resources, in that area. Simulation is done in NS2, for different areas and has got some QoS parameter readings or pattern for these different areas. For all areas different QoS ranges are calculated. While standardizing area definitions above parameter value ranges will be required to be finalized for respective areas. Paper shows mathematical model for different parameters. Simulation is done on hypothetical model. On the same line we can define for real models.
Keywords :
quality of service; standardisation; NS2 simulation; Okumura-Hata model; QoS parameters patterns; catastrophic ICT area standardization; end-to-end delay; information and communication technology; intensity E patterns; mathematical model; Information and communication technology (ICT); catastrophic area (RPC); poor area; rural area; standardization;
Conference_Titel :
Wireless Personal Multimedia Communications (WPMC), 2012 15th International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-4533-0