The thermoreflectance approach in Dynamic Thermometry and Thermophysical Property Measurement for Thermal Design of Electronics

This presentation is a part of the Special Session on Dynamic Thermometry and Thermophysical Property Measurement for Thermal Design of Electronics, and aims at providing a perspective on the physics of thermoreflectance (TR) and its application to measuring the thermal properties of thin-film electronic materials and the surface temperature fields of active devices. The existence of a dependence between the temperature of a surface and the reflectivity of that surface has long been known. But, since that dependence is generally weak, on the order of 10^-3 or 10^-4 per Kelvin, it was not immediately obvious how to leverage thermoreflectance physics as a thermal metrological tool. More recently, however, several research teams around the world have found success in the use of TR as a means of measuring thermal properties and temperature, and there have been early successful efforts in productizing thermal measurement instruments based on the TR approach.