• DocumentCode
    586904
  • Title

    A 60nW voltage reference circuit generating 1.0V using BJTs and subthreshold MOSFET

  • Author

    Bansal, Ankur ; Raja, M. Kumarasamy ; Je Minkyu

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2012
  • fDate
    21-23 Nov. 2012
  • Firstpage
    113
  • Lastpage
    115
  • Abstract
    An ultra low power voltage reference circuit generating 1.0V and consuming 60nW from power supply of 1.3V is fabricated in 0.13um CMOS 1P6M process. It can work from battery voltage of 1.3V to 3.6V. The proposed reference circuit uses BJTs and a MOSFET operating in subthreshold region to generate temperature stable reference voltage. The reference circuit proposed in this work generates 1.0V unlike the conventional bandgap circuit where it is 1.2V. Conventional bandgap circuits use baseemitter voltage (VBE) of BJT as CTAT signal while proposed reference circuit uses gate-source voltage (VGS) of a sub-threshold region biased MOSFET. The reference voltage is an estimate of threshold voltage extrapolated up to 0°K. Subthreshold MOSFET used in this circuit is a high voltage transistor having threshold voltage of 0.65V at room temperature, hence it generates 1.0V. Using a low voltage MOSFET having threshold voltage 0.35V, this circuit generates reference voltage of 0.5V.
  • Keywords
    MOSFET; bipolar transistors; reference circuits; BJT; conventional bandgap circuit; high voltage transistor; power 60 nW; size 0.13 mum; subthreshold MOSFET; temperature 293 K to 298 K; ultra low power voltage reference circuit; voltage 0.5 V; voltage 0.65 V; voltage 1.0 V; voltage 1.3 V to 3.6 V; Logic gates; MOSFET circuits; Photonic band gap; Resistors; Temperature measurement; Threshold voltage; Voltage measurement; BJT; bandgap voltage; subthreshold MOSFET; voltage reference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology (RFIT), 2012 IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-2303-1
  • Type

    conf

  • DOI
    10.1109/RFIT.2012.6401631
  • Filename
    6401631