• DocumentCode
    58714
  • Title

    Transconductance Linearity Analysis of 1-D, Nanowire FETs in the Quantum Capacitance Limit

  • Author

    Razavieh, A. ; Janes, David B. ; Appenzeller, J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    60
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    2071
  • Lastpage
    2076
  • Abstract
    The impact of channel material and dimensionality on the linearity of nanowire transistors is studied theoretically. This paper also evaluates various scattering mechanisms in this context. While operating under 1-D transport conditions in the quantum capacitance limit, the achievable device linearity strongly depends on the details of the scattering mechanisms limiting the transport. Interestingly, it is not only the scattering length that determines the third-order intercept point but also the particular energy dependence of the dominant-scattering mechanism that needs to be considered. Our results provide critical insights for the choice of material to obtain the desired device linearity.
  • Keywords
    field effect transistors; nanoelectronics; nanowires; scattering; 1D nanowire FET; 1D transport conditions; channel material impact; dominant-scattering mechanism; nanowire transistor linearity; quantum capacitance limit; scattering length; scattering mechanisms; third-order intercept point; transconductance linearity analysis; 1-D transport; RF linearity; ballistic transport; nanowire transistor; quantum capacitance; scattering; transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2259238
  • Filename
    6515592