DocumentCode
58714
Title
Transconductance Linearity Analysis of 1-D, Nanowire FETs in the Quantum Capacitance Limit
Author
Razavieh, A. ; Janes, David B. ; Appenzeller, J.
Author_Institution
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
60
Issue
6
fYear
2013
fDate
Jun-13
Firstpage
2071
Lastpage
2076
Abstract
The impact of channel material and dimensionality on the linearity of nanowire transistors is studied theoretically. This paper also evaluates various scattering mechanisms in this context. While operating under 1-D transport conditions in the quantum capacitance limit, the achievable device linearity strongly depends on the details of the scattering mechanisms limiting the transport. Interestingly, it is not only the scattering length that determines the third-order intercept point but also the particular energy dependence of the dominant-scattering mechanism that needs to be considered. Our results provide critical insights for the choice of material to obtain the desired device linearity.
Keywords
field effect transistors; nanoelectronics; nanowires; scattering; 1D nanowire FET; 1D transport conditions; channel material impact; dominant-scattering mechanism; nanowire transistor linearity; quantum capacitance limit; scattering length; scattering mechanisms; third-order intercept point; transconductance linearity analysis; 1-D transport; RF linearity; ballistic transport; nanowire transistor; quantum capacitance; scattering; transconductance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2259238
Filename
6515592
Link To Document