• DocumentCode
    58726
  • Title

    Temporal Growth Study in Trapezoidally Corrugated Slow-Wave Structure for Backward-Wave Oscillator

  • Author

    Amin, M.R. ; Ogura, Kanayo

  • Author_Institution
    Department of Electrical and Electronic Engineering, Islamic University of Technology, Gazipur, Bangladesh
  • Volume
    41
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    2257
  • Lastpage
    2263
  • Abstract
    The temporal growth rate (TGR) in a trapezoidally corrugated slow-wave structure for a backward-wave oscillator is theoretically studied. An intense relativistic annular electron is used as the energy source for the device. The annular electron beam is assumed to be infinitesimally thin in the radial extent and guided by an infinitely strong magnetic field. The trapezoidal profile of the structure is approximated by a sinusoidal function using Fourier approximation, and the dispersion relation of the system is derived using the Rayleigh–Fourier method. To study the TGR of the electromagnetic wave inside the system, the dispersion equation is solved for different values of the beam parameters. The dimensions of sinusoidally corrugated comparable trapezoidal structure are determined by comparing their dispersion characteristics. For the {\\rm TM}_{01} mode, TGR of instability that gives a qualitative measure of the microwave generation is calculated. The peak TGR of the proposed structure is found to be on average 1.5% higher than that of the sinusoidally corrugated slow-wave structure for the same set of beam parameters. Apart from its improved growth rate, the proposed structure has an added advantage of easy fabrication.
  • Keywords
    Dispersion; Electron beams; Harmonic analysis; Microwave oscillators; Microwave theory and techniques; Periodic structures; Backward wave oscillator (BWO); electron beam; growth rate; slow-wave structure;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2258406
  • Filename
    6515593