Edge diffraction in the scattering of focused terahertz radiation

Author

Samoylov, L.L. ; Trukhin, V.N. ; Buyskikh, A.S. ; Horkov, D.P.

Author_Institution

Ioffe Phys. Tech. Inst., St. Petersburg, Russia

fYear

2012

fDate

May 28 2012-June 1 2012

Firstpage

211

Lastpage

214

Abstract

The terahertz (THz) near-field microscope is a powerful diagnostic test instrument for nanotechnology, allowing of measuring of spectral characteristics of objects much less than the THz wavelength. It is based on the processes of interaction between THz electric field and an object situated in the very presence of the scanning probe microscope (SPM) probe. These processes are specified by the interaction of the nanoobject under test with the near-field component of the electric field near the tip of the SPM probe which is illuminated by broadband coherent THz pulses.

Keywords

microwave photonics; nanophotonics; scanning probe microscopy; terahertz wave devices; terahertz wave spectra; SPM probe; THz electric field; broadband coherent THz pulses; diagnostic test instrument; edge diffraction; focused terahertz radiation scattering; nanoobject; nanotechnology; near-field component; scanning probe microscopy probe; spectral characteristics; terahertz near-field microscopy; Diffraction; Electromagnetic scattering; Geometry; Microscopy; Probes; Surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Days on Diffraction (DD), 2012

Conference_Location

St. Petersburg

Print_ISBN

978-1-4673-4418-0

Type

conf

DOI

10.1109/DD.2012.6402781

Filename

6402781