Title :
Catalyst design for native oxide based selective area InP nanowire growth
Author :
Calahorra, Y. ; Greenberg, Yoko ; Cohen, Sholom ; Ritter, Daniel
Author_Institution :
Dept. of Electr. Eng., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
E-beam lithography based nanowire catalysts are defined by a two dimensional parameter space, spanned by metallization thickness and resist pinhole diameter. We report that native oxide based selective area nanowire growth allowed reducing the metallization thickness of catalysts down to 1/20 of the resist pinhole diameter, without thermal catalyst splitting; contrary to native oxide free nanowire growth, where catalyst splitting is a limiting effect. This parameter space allows growing similar-diameter nanowires, by two different parameter sets. In one such case, nanowires of about 50 nm grew at considerably different rates determined by the metallization thickness; indicating that at given conditions, nanowire diameter does not solely determine nanowire growth rate.
Keywords :
III-V semiconductors; catalysts; electron beam lithography; indium compounds; metallisation; nanofabrication; nanolithography; nanowires; resists; 2D parameter space; E-beam lithography; InP; catalyst design; metallization thickness; nanowire catalysts; native oxide; resist pinhole diameter; selective area InP nanowire growth; thermal catalyst splitting; Gold; Lithography; Metallization; Nanoparticles; Resists; Scanning electron microscopy; Shape;
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 2012 International Conference on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4673-1725-2
DOI :
10.1109/ICIPRM.2012.6403374