• DocumentCode
    588146
  • Title

    Quasi-double gate mode for sleep transistors in UTBB FD SOI low-power high-speed applications

  • Author

    Bol, David ; Kilchytska, V. ; De Vos, J. ; Andrieu, F. ; Flandre, Denis

  • Author_Institution
    ICTEAM Inst., Univ. catholique de Louvain, Louvain-la-Neuve, Belgium
  • fYear
    2012
  • fDate
    1-4 Oct. 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Power-gating enables low stand-by power for high-speed applications. In this paper, we exploit the unique feature of quasi-double gate (QDG) mode MOSFETs in UTBB SOI to boost the performances of the power-gating sleep transistor. According to experimental results on a 10-nm BOX, at nominal Vg QDG mode enables up to 35% width and thereby leakage reduction for the sleep transistor. At circuit level, a charge pump architecture is proposed to generate the QDG back-gate bias for a 100-mA power-gated CPU with sub-100 ns wake-up/sleep times and negligible power/area overheads.
  • Keywords
    MOSFET; charge pump circuits; low-power electronics; silicon-on-insulator; MOSFET QDG mode; UTBB FD SOI low-power high-speed applications; charge pump architecture; circuit level; current 100 mA; leakage reduction; power-area overheads; power-gating; power-gating sleep transistor; quasidouble gate mode; size 10 nm; ultrathin body and buried oxide fully-depleted SOI technology; Charge pumps; Logic gates; MOSFETs; Semiconductor device modeling; Switching circuits; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference (SOI), 2012 IEEE International
  • Conference_Location
    NAPA, CA
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-4673-2690-2
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2012.6404370
  • Filename
    6404370