DocumentCode :
588670
Title :
An Advanced Methodology for Measuring and Characterizing Software Aging
Author :
Pengfei Zheng ; Qingguo Xu ; Yong Qi
Author_Institution :
Sch. of Electron. & Inf. Eng., Xi´an Jiaotong Univ., Xi´an, China
fYear :
2012
fDate :
27-30 Nov. 2012
Firstpage :
253
Lastpage :
258
Abstract :
Software systems continuously running over a long time may suffer gradual performance degradation or failure rate increasing. This phenomenon, known as "Software Aging", has become a great challenge to dependability-critical software systems. Researchers have made remarkable achievements in predicting resource exhaustion time and designing optimal rejuvenation plan. However, limited works focus on measuring aging and characterizing aging progress. And currently the only widely used tool is Sen\´s slope estimator. We pinpoint some drawbacks of this approach: (1) a not unified estimator which needs periodicity test and period length inference in advance (2) an oversimplified linear description of aging pro-gress (3) with no ability to distinguish between abrupt change and the "aging-like" gradual degradation. We design an enumerative Hodrick-Prescott filter to overcome all these short-comings. And we also propose a new metric AS based on the nonlinear trend estimated by Hodrick-Prescott filter to dynamically measure severity of aging. Our approach and metric are validated on real aging time series collected from a VOD (video-on-demand) server. The results shows our approach improve the Sen\´s slope estimator a lot.
Keywords :
safety-critical software; Hodrick-Prescott filter; advanced methodology; characterizing software aging; dependability critical software systems; measuring software aging; performance degradation; Aging; Degradation; Market research; Servers; Software; Software measurement; Time series analysis; Aging progress; Hodrick-Prescott filter; Measurement; Sen´s Slope Estimator; Software Aging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering Workshops (ISSREW), 2012 IEEE 23rd International Symposium on
Conference_Location :
Dallas, TX
Print_ISBN :
978-1-4673-5048-8
Type :
conf
DOI :
10.1109/ISSREW.2012.81
Filename :
6405451
Link To Document :
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