Analysis of dielectric-covered waveguide longitudinal slots

A robust approach to analysis the dielectric-covered waveguide longitudinal slot on the basis of M-M´s method is proposed. The new approach takes full advantages of the three-level GPOF, which can give accurate evaluation even without rigorous investigation of the spectral-domain behavior of the Green´s functions in advance. Moreover, the SWP extraction and the changes of variables needn´t be done any more. Thus, it is quite robust and very suitable for the development of CAD tools. The proposed approach has been validated by the simulation and experiment data taken from previous publications, and also by a commercial finite-element software HFSS.