• DocumentCode
    59092
  • Title

    Electro-Optical Response Analysis of a 40 Gb/s Silicon Mach-Zehnder Optical Modulator

  • Author

    Jianfeng Ding ; Ruiqiang Ji ; Lei Zhang ; Lin Yang

  • Author_Institution
    State Key Lab. on Integrated Optoelectron., Inst. of Semicond., Beijing, China
  • Volume
    31
  • Issue
    14
  • fYear
    2013
  • fDate
    15-Jul-13
  • Firstpage
    2434
  • Lastpage
    2440
  • Abstract
    We demonstrate a 40 Gbit/s silicon Mach-Zehnder optical modulator driven by a differential voltage of 0.36 Vpp. The energy efficiency is as low as 32.4 fJ/bit which is near the power efficiency of the ring modulator. We analyze the relationship between the electrical bandwidth and the electro-optical (EO) bandwidth based on the electrical S parameter measurement. Because of the nonlinear response, the electro-optical bandwidths in the small-signal tests are is slightly different when the modulator is biased at different transmission points. But the EO response is much different when the optical phase change is large enough to cover the nonlinear and linear regions at the same time. The nonlinearity can greatly improve the EO response in large-signal test. In our experiment, the rise/fall (20%-80%) time decreases from 13 ps to 10 ps as the driving amplitude increases from 5 V to 6 V under the same reverse bias of 3 V.
  • Keywords
    Mach-Zehnder interferometers; electro-optical modulation; integrated optics; integrated optoelectronics; silicon; Si; bit rate 40 Gbit/s; electrical S parameter measurement; electrical bandwidth; electrooptical bandwidth; electrooptical response analysis; energy efficiency; optical phase change; power efficiency; ring modulator; silicon Mach-Zehnder optical modulator; time 10 ps; time 13 ps; voltage 0.36 V; voltage 3 V; voltage 5 V; voltage 6 V; Bandwidth; Electrooptic modulators; Nonlinear optics; Optical distortion; Silicon; Integrated optoelectronics; optical modulation;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2013.2262522
  • Filename
    6515626