DocumentCode
59143
Title
Energy Landscape Model of Conduction and Phase Transition in Phase Change Memories
Author
Rizzi, Maurizio ; Ferro, Marcello ; Fantini, P. ; Ielmini, Daniele
Author_Institution
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Volume
60
Issue
11
fYear
2013
fDate
Nov. 2013
Firstpage
3618
Lastpage
3624
Abstract
Conduction and switching in the phase-change memory (PCM) strongly depend on the transport mechanisms in the disordered amorphous phase. To predict the programming characteristics and the scaling behavior of PCM, accurate models for transport in the amorphous phase considering the local disorder are essential. This paper presents a numerical model to study the subthreshold conduction in the amorphous state of PCM. The nonhomogeneous active material is described through a potential energy landscape, dictating the local barrier for electron hopping. The model shows strong percolation effects in the amorphous cap of the high resistance state, thus accounting for the observed relationship between the electrical and physical thicknesses of the amorphous cap and for the observed thickness dependence of resistance. The model is finally used to describe the programming characteristics with better accuracy in the transition regime from set to reset, which is critical for multilevel cell applications.
Keywords
integrated circuit modelling; numerical analysis; phase change memories; PCM; conduction transition; disordered amorphous phase; electron hopping; energy landscape model; high resistance state; multilevel cell applications; nonhomogeneous active material; numerical model; percolation effects; phase change memories; phase transition; programming characteristic prediction; subthreshold conduction phase; transport mechanisms; Current density; Ear; Electric potential; Energy barrier; Phase change materials; Programming; Resistance; Conduction; energy landscape; phase transition; phase-change memory (PCM);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2280791
Filename
6637070
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