Title :
An innovative waveguide interface and quarter-wavelength shim for the 220∓325 GHz band
Author :
Lau, Y.S. ; Vondran, D.J.
Author_Institution :
OML, Inc., Morgan Hill, CA, USA
Abstract :
An innovative waveguide flange offers superior alignment based on a concentric mating mechanism consisting of a boss and jack interface. Above 100 GHz, this flange interface improves repeatability and precision of S-parameters measurements by eliminating the mechanical tolerance build-up associated with separate alignment pins. By simplifying the build-up of tolerance to only the boss and jack interface, the alignment improves match, precision, repeatability and residual calibration performance for mm-wave and sub-mm-wave S-parameter measurements. This flange is entirely compatible with the MIL-DTL-3922/67D standard. This paper presents connection repeatability for 220-325 GHz (WR-03 band). This flange is awaiting standardization in the P1785 working group of IEEE.
Keywords :
S-parameters; calibration; submillimetre wave measurement; waveguides; MIL-DTL-3922-67D standard; boss interface; concentric mating mechanism; flange interface; frequency 220 GHz to 325 GHz; innovative waveguide interface; jack interface; quarter-wavelength shim; residual calibration performance; sub-mm-wave S-parameter measurements; Calibration; Flanges; Lifting equipment; Loss measurement; Millimeter wave measurements; Pins; Standards; LRL; MIL-DTL-3922/67D; Millimeter; S-parameters; TRL; shim; vector network analyzer; waveguide flange;
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-4817-1
Electronic_ISBN :
978-1-4673-4820-1
DOI :
10.1109/ARFTG.2012.6422431
