• DocumentCode
    59154
  • Title

    A 300-MS/s, 1.76-ps-Resolution, 10-b Asynchronous Pipelined Time-to-Digital Converter With on-Chip Digital Background Calibration in 0.13-µm CMOS

  • Author

    Jun-Seok Kim ; Young-Hun Seo ; Yunjae Suh ; Hong-June Park ; Jae-Yoon Sim

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol. (POSTECH), Pohang, South Korea
  • Volume
    48
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    516
  • Lastpage
    526
  • Abstract
    This paper presents an asynchronous pipelined all-digital 10-b time-to-digital converter (TDC) with fine resolution, good linearity, and high throughput. Using a 1.5-b/stage pipeline architecture, an on-chip digital background calibration is implemented to correct residue subtraction error in the seven MSB stages. An asynchronous clocking scheme realizes pipeline operation for higher throughput. The TDC was implemented in standard 0.13-μm CMOS technology and has a maximum throughput of 300 MS/s and a resolution of 1.76 ps with a total conversion range of 1.8 ns. The measured DNL and INL were 0.6 LSB and 1.9 LSB, respectively.
  • Keywords
    CMOS digital integrated circuits; asynchronous circuits; calibration; pipeline processing; time-digital conversion; CMOS technology; MSB stages; asynchronous clocking scheme; asynchronous pipelined time-to-digital converter; on-chip digital background calibration; pipeline architecture; pipeline operation; residue subtraction error; size 0.13 mum; time 1.76 ps; time 1.8 ns; word length 1.5 bit; word length 10 bit; Calibration; Delay; Linearity; Pipeline processing; Positron emission tomography; Throughput; Time domain analysis; Asynchronous pipeline; digital background calibration; time amplifier; time-to-digital converter (TDC);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2012.2217892
  • Filename
    6335441