• DocumentCode
    594040
  • Title

    Minimizing simultaneous switching noise at reduced power with power transmission lines for high-speed signaling

  • Author

    Telikepalli, S. ; Swaminathan, Madhavan ; Keezer, D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2012
  • fDate
    21-24 Oct. 2012
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    Signal and power integrity are crucial for ensuring high performance in high speed digital systems. As the operating frequency of digital systems increases, the power and ground bounce created by simultaneous switching noise (SSN) has become a limiting factor for the performance of these devices. SSN is caused by parasitic inductance that exists in the power delivery network (PDN), and voltage fluctuations on the power and ground rails can lead to reduced noise margins and can limit the maximum frequency of a digital device. A new PDN design has been suggested that achieves significantly reduced SSN [1] by replacing the power plane structure with a power transmission line (PTL). In this paper, a new power delivery scheme is shown to significantly reduce switching noise at lower power. This concept has been demonstrated through theory, simulation, and measurements.
  • Keywords
    interference suppression; power transmission lines; digital device; high speed digital system; high speed signaling; maximum frequency; parasitic inductance; power delivery network; power delivery scheme; power integrity; power plane structure; power transmission lines; reduced power; simultaneous switching noise minimization; voltage fluctuations; Power supplies; Power transmission lines; Resistance; Resistors; Switches; Transmission line measurements; Vehicles; power delivery network; power transmission line; simultaneous switching noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
  • Conference_Location
    Tempe, AZ
  • Print_ISBN
    978-1-4673-2539-4
  • Electronic_ISBN
    978-1-4673-2537-0
  • Type

    conf

  • DOI
    10.1109/EPEPS.2012.6457836
  • Filename
    6457836