• DocumentCode
    594061
  • Title

    Chip oriented target impedance for digital power distribution network design

  • Author

    Tanaka, M.S. ; Toyama, Munehiro ; Nakashima, Hideharu ; Yamada, J. ; Haida, M. ; Ooshima, I.

  • Author_Institution
    Renesas Electron. Corp., Kawasaki, Japan
  • fYear
    2012
  • fDate
    21-24 Oct. 2012
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    With the advancements in semiconductor process technologies in recent years, noise management has become more difficult. Therefore power distribution network (PDN) design has become more important. This paper describes the target impedance build method. The key techniques are to find the impedance border line of normal chip operation and to set the target impedance which does not exceed that border line. The target impedance which is produced by the proposed method is useful in optimizing the design margin and reducing the chip/package/board size. From the experimental result using a 45-nm process Test Element Group (TEG) chip, the package size was reduced by 21.5%, and the chip size was reduced by 16.4% in comparison with the original design which was not designed using the target impedance. Furthermore, normal chip operation was confirmed by the actual measurement. On the other hand, a working design pattern was not able to be found in the target impedance which was produced by the conventional method. The experimental result demonstrates the validation of the proposed method.
  • Keywords
    chip scale packaging; electric impedance; integrated circuit design; integrated circuit measurement; integrated circuit noise; integrated circuit testing; power supplies to apparatus; semiconductor technology; PDN design; TEG chip; chip oriented target impedance; chip size; chip-package-board size reduction; design margin optimization; digital power distribution network design; impedance border line; noise management; normal chip operation; package size; semiconductor process technologies; target impedance; target impedance build method; test element group chip; working design pattern; Capacitance; Delay; Digital circuits; Estimation; Impedance; Power system dynamics; System-on-a-chip; IR-drop; co-design; target impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
  • Conference_Location
    Tempe, AZ
  • Print_ISBN
    978-1-4673-2539-4
  • Electronic_ISBN
    978-1-4673-2537-0
  • Type

    conf

  • DOI
    10.1109/EPEPS.2012.6457881
  • Filename
    6457881