DocumentCode :
594339
Title :
Pulsed-field EMI susceptibility analysis of microelectronic circuits - A full time-domain methodology
Author :
de Hoop, Adrianus T. ; Blok, H. ; Lager, Ioan E. ; Stumpf, Martin ; Vandenbosch, Guy A. E.
Author_Institution :
Fac. of Electr. Eng., Math. & Comput. Sci., Delft Univ. of Technol., Delft, Netherlands
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
337
Lastpage :
339
Abstract :
A full time-domain methodology is developed for analyzing the susceptibility of microwave electronic circuits to pulsed-field electromagnetic (EM) disturbances. The method is based on the consideration that micro-electronic circuits in their EM radiation behavior can be conceived as to consist of open (parallel-plate) resonators that are mutually coupled through their connecting feeds and are susceptible to disturbing incident fields through their apertures. In this respect, they are similar in behavior to the well-known ultra wideband patch antennas. The key issue to the method is to characterize each of these resonators by its natural modes of oscillation. Theoretically, these natural oscillations are adequately modelled through the time Laplace transform domain counterparts of the electromagnetic reciprocity theorem of the time-convolution type.
Keywords :
Laplace transforms; electromagnetic interference; microstrip antennas; microwave integrated circuits; resonators; time-domain analysis; ultra wideband antennas; EM radiation behavior; electromagnetic reciprocity theorem; incident fields; microwave electronic circuits; natural oscillation modes; open resonators; parallel-plate resonators; pulsed-field EM disturbance; pulsed-field EMI susceptibility analysis; pulsed-field electromagnetic disturbance; time Laplace transform domain counterparts; time-convolution type; time-domain methodology; ultrawideband patch antennas; Integrated circuit modeling; Magnetic susceptibility; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2012 42nd European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2215-7
Electronic_ISBN :
978-2-87487-026-2
Type :
conf
Filename :
6459110
Link To Document :
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