DocumentCode
594682
Title
Feature analysis for automatic classification of HEp-2 florescence patterns : Computer-Aided Diagnosis of Auto-immune diseases
Author
Ghosh, Sudip ; Chaudhary, Varun
Author_Institution
Dept. of Comput. Sci. & Eng., State Univ. of New York (SUNY) at Buffalo, Buffalo, NY, USA
fYear
2012
fDate
11-15 Nov. 2012
Firstpage
174
Lastpage
177
Abstract
Indirect ImmunoFluorescence (IIF) is currently the recommended method for the detection of antinuclear autoantibodies(ANA). It is an effective technique to reveal the presence of auto immune diseases; however, it is a subjective method and hence dependent on the experience and expertise of the physician. Moreover, inter-observer variability limits the reproducibility of IIF reading. To this end, we propose feature extraction methods for automatic recognition of staining patterns of HEp-2 images (provided as a part of the ICPR 2012 HEp-2 Cells Classification Contest) to develop a Computer-Aided Diagnosis system and support the specialists´ decision. We compare the performances of various individual and combined features and show that a combination of HOG(Histogram of Oriented Gradients), Texture and ROI(Region of Interest) features are best suited for our task achieving an overall accuracy of 91.13% using a Support Vector Machine as classifier.
Keywords
diseases; feature extraction; fluorescence; image texture; medical image processing; support vector machines; ANA; HEp-2 florescence patterns; HEp-2 images; Histogram of Oriented Gradients; ICPR 2012 HEp-2 cells classification contest; IIF; ROI; antinuclear autoantibodies; auto immune diseases; auto-immune diseases; automatic classification; automatic recognition; computer-aided diagnosis system; feature analysis; feature extraction methods; image texture; indirect immunofluorescence; inter-observer variability limits; region of interest features; staining patterns; support vector machine; Accuracy; Diseases; Feature extraction; Pattern recognition; Robustness; Support vector machines; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location
Tsukuba
ISSN
1051-4651
Print_ISBN
978-1-4673-2216-4
Type
conf
Filename
6460100
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