DocumentCode :
594973
Title :
Scale-invariant sampling for supervised image segmentation
Author :
Yan Li ; Loog, Marco
Author_Institution :
Pattern Recognition Lab., Delft Univ. of Technol., Delft, Netherlands
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
1399
Lastpage :
1402
Abstract :
Scale invariance is a desirable property for many vision tasks such as image segmentation and classification. One way to achieve such invariance is to collect images containing objects of all scales and then train a classifier. In practice, however, only a finite number of images at a finite number of scales can be collected, and this poses the problem of scale sampling. In this paper, we focus on how to properly sample over scales in order to solve scale-invariant image segmentation. The ideal distributions of images and features in a scale-invariant setting are derived, and their implications for scale sampling and feature extraction are studied. Some basic image segmentation experiments are conducted to examine the sampling rules proposed, which show that it is possible to train a scale-invariant classifier from a single image.
Keywords :
computer vision; feature extraction; image classification; image sampling; image segmentation; feature extraction; sampling rules; scale-invariant classifier training; scale-invariant image segmentation; scale-invariant sampling; supervised image segmentation; vision tasks; Feature extraction; Histograms; Image segmentation; Pattern recognition; Shape; Training; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
ISSN :
1051-4651
Print_ISBN :
978-1-4673-2216-4
Type :
conf
Filename :
6460402
Link To Document :
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