• DocumentCode
    595040
  • Title

    Optimal metric selection for improved multi-pose face recognition with group information

  • Author

    Xin Zhang ; Due-Son Pharn ; Wanquan Liu ; Venkatesh, Svetha

  • Author_Institution
    IMPCA, Curtin Univ., Bentley, WA, Australia
  • fYear
    2012
  • fDate
    11-15 Nov. 2012
  • Firstpage
    1675
  • Lastpage
    1678
  • Abstract
    We address the limitation of sparse representation based classification with group information for multi-pose face recognition. First, we observe that the key issue of such classification problem lies in the choice of the metric norm of the residual vectors, which represent the fitness of each class. Then we point out that limitation of the current sparse representation classification algorithms is the wrong choice of the ℓ2 norm, which does not match with data statistics as these residual values may be considerably non-Gaussian. We propose an explicit but effective solution using ℓp norm and explain theoretically and numerically why such metric norm would be able to suppress outliers and thus can significantly improve classification performance comparable to the state-of-arts algorithms on some challenging datasets.
  • Keywords
    face recognition; image classification; image representation; pose estimation; sparse matrices; classification performance; data statistics; group information; l2 norm; multipose face recognition; optimal metric selection; outlier suppression; residual vector metric norm; sparse representation classification algorithm; Face; Face recognition; Lighting; Measurement; Robustness; Training; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2012 21st International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4673-2216-4
  • Type

    conf

  • Filename
    6460470