DocumentCode
595100
Title
Multi scale multi structuring element top-hat transform for linear feature detection
Author
Xiangzhi Bai ; Fugen Zhou ; Bindang Xue
Author_Institution
Image Process. Center, Beihang Univ., Beijing, China
fYear
2012
fDate
11-15 Nov. 2012
Firstpage
1920
Lastpage
1923
Abstract
To efficiently detect all the possible linear features, a multi scale multi structuring element top-hat transform based algorithm is proposed in this paper. The algorithm is divided into two parts: the multi scale multi structuring element top-hat transform and postprocessing. In the multi scale multi structuring element top-hat transform, multi scales of multi structuring elements with increasing sizes are used by the top-hat transform to extract the useful information of linear features. In the post processing, the detected linear feature regions are binarized, firstly. Then, the small noise regions are removed. After that, the final linear feature regions are thinned to form the final binary detected linear features. Experimental results show that, the proposed algorithm could efficiently detect all the possible linear features of different types of images and could be widely used for linear feature detection in different applications.
Keywords
feature extraction; information retrieval; wavelet transforms; binary detected linear feature; image post processing; linear feature detection; linear feature information extraction; linear feature region; multiscale multistructure element top-hat transform; Algorithm design and analysis; Detectors; Feature extraction; Image edge detection; Noise; Pattern recognition; Transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location
Tsukuba
ISSN
1051-4651
Print_ISBN
978-1-4673-2216-4
Type
conf
Filename
6460531
Link To Document